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Paper: Hardness of k-LWE and Applications in Traitor Tracing

Authors:
San Ling
Duong Hieu Phan
Damien Stehlé
Ron Steinfeld
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URL: https://eprint.iacr.org/2014/494
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BibTeX
@article{eprint-2014-25636,
  title={Hardness of k-LWE and Applications in Traitor Tracing},
  journal={IACR Cryptology ePrint Archive},
  volume={2014},
  pages={494},
  url={https://eprint.iacr.org/2014/494},
  author={San Ling and Duong Hieu Phan and Damien Stehlé and Ron Steinfeld},
  year=2014
}